基于 HDL 的 32 位 ALU 设计实例的数字电路测试
Journal: Advances in Computer and Autonomous Intelligence Research DOI: 10.32629/acair.v4i1.19377
Abstract
由于电子技术发展迅速,现在电子行业和学术界都开始利用硬件描述语言(HDL)进行仿真测试。本文首先介绍数字电路测试的基本原理,随后以一个32位算术逻辑单元(ALU)芯片为研究对象,搭建一个虚拟仿真测试平台。在这个平台里测试10轮数据,发现芯片错误数量从最初的50个显著下降至20个以下,同时测试覆盖率稳步提升。成功验证了ALU的加减乘除及逻辑运算功能。
Keywords
数字电路测试；硬件描述语言(HDL)；ALU；仿真验证；故障检测
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